검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Analysis of III-V layer stacks on INP substrates using spectroscopic ellipsometry in the NIR spectral range Bukkems HG, Oei YS, Richter U, Gruska B Thin Solid Films, 364(1-2), 165, 2000 |
| No. | Article |
|---|---|
| 1 |
Analysis of III-V layer stacks on INP substrates using spectroscopic ellipsometry in the NIR spectral range Bukkems HG, Oei YS, Richter U, Gruska B Thin Solid Films, 364(1-2), 165, 2000 |