검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Hot carrier degradation mechanism interpretation by lateral distribution of interface and bulk trap density Chae H, Shin S, Choi J, Seo S Current Applied Physics, 15(11), 1412, 2015 |
| No. | Article |
|---|---|
| 1 |
Hot carrier degradation mechanism interpretation by lateral distribution of interface and bulk trap density Chae H, Shin S, Choi J, Seo S Current Applied Physics, 15(11), 1412, 2015 |