검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
The defect-centric perspective of device and circuit reliability-From gate oxide defects to circuits Kaczer B, Franco J, Weckx P, Roussel PJ, Simicic M, Putcha V, Bury E, Cho M, Degraeve R, Linten D, Groeseneken G, Debacker P, Parvais B, Raghavan P, Catthoor F, Rzepa G, Waltl M, Goes W, Grasser T Solid-State Electronics, 125, 52, 2016 |
| 2 |
Low-power DRAM-compatible Replacement Gate High-k/Metal Gate Stacks Ritzenthaler R, Schram T, Bury E, Spessot A, Caillat C, Srividya V, Sebaai F, Mitard J, Ragnarsson LA, Groeseneken G, Horiguchi N, Fazan P, Thean A Solid-State Electronics, 84, 22, 2013 |