검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Application of ellipsometry for the accurate oxide layer measurement on silicon spheres Busch I, Liu WD, Chen C, Luo ZY, Koenders L Applied Surface Science, 421, 624, 2017 |
| 2 |
Investigation of interface roughness and roughness correlation in solid-state multilayer by coplanar diffuse X-ray scattering Busch I, Stumpel J Applied Surface Science, 212, 201, 2003 |