검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Application of a novel test system to characterize single-event effects at cryogenic temperatures Ramachandran V, Gadlage MJ, Ahlbin JR, Narasimham B, Alles ML, Reed RA, Bhuva BL, Massengill LW, Black JD, Foster CN Solid-State Electronics, 54(10), 1052, 2010 |