검색결과 : 8건
| No. | Article |
|---|---|
| 1 |
Effects of shallow trench isolation on low frequency noise characteristics of source-follower transistors in CMOS image sensors Kwon SK, Kwon HM, Choi WI, Song HS, Lee HD Solid-State Electronics, 119, 29, 2016 |
| 2 |
Tri-linear color multi-linescan sensor with 200 kHz line rate Schrey O, Brockherde W, Nitta C, Bechen B, Bodenstorfer E, Brodersen J, Mayer KJ Solid-State Electronics, 125, 220, 2016 |
| 3 |
Charge Transfer Inefficiency in Pinned Photodiode CMOS image sensors: Simple Montecarlo modeling and experimental measurement based on a pulsed storage-gate method Pelamatti A, Goiffon V, Chabane A, Magnan P, Virmontois C, Saint-Pe O, de Boisanger MB Solid-State Electronics, 125, 227, 2016 |
| 4 |
Modeling of the charge transfer in a lateral drift field photo detector Driewer A, Hosticka BJ, Spickermann A, Vogt H Solid-State Electronics, 126, 51, 2016 |
| 5 |
Overview of CMOS image sensor use in molecular diagnostics Devadhasan JP, Yoo IS, Kim S Current Applied Physics, 15(3), 402, 2015 |
| 6 |
Effect of chemical mechanical treatment on the optoelectronic properties in CMOS image sensor Choi E, Kim A, Kwon SH, Cui Y, Lee SJ, Lee U, Choi HS, Hahn SJ, Yoon SP, Son HB, Pyo SG Korean Journal of Chemical Engineering, 32(2), 199, 2015 |
| 7 |
New mechanism of plasma induced damage on CMOS image sensor: Analysis and process optimization Carrere JP, Oddou JP, Place S, Richard C, Benoit D, Jenny C, Gatefait M, Aumont C, Tournier A, Roy F Solid-State Electronics, 65-66, 51, 2011 |
| 8 |
Online monitoring of pore distribution in microporous membrane Chang M, Deka JR, Tszeng CT, Cheng PR Desalination, 234(1-3), 66, 2008 |