화학공학소재연구정보센터
검색결과 : 6건
No. Article
1 Surface morphology and reaction at Cu/Si interface - Effect of native silicon suboxide
Benouattas N, Mosser A, Bouabellou A
Applied Surface Science, 252(20), 7572, 2006
2 Formation of copper silicides by high dose metal vapor vacuum arc ion implantation
Rong C, Zhang JH, Li WZ
Applied Surface Science, 220(1-4), 40, 2003
3 Diffusion barrier performance of thin Cr films in the Cu/Cr/Si structure
Ezer Y, Harkonen J, Sokolov V, Saarilahti J, Kaitila J, Kuivalainen P
Materials Research Bulletin, 33(9), 1331, 1998
4 TiW(N) as Diffusion-Barriers Between Cu and Si
Chiou JC, Juang KC, Chen MC
Journal of the Electrochemical Society, 142(7), 2326, 1995
5 Room-Temperature Oxidation of Silicon in the Presence of Cu3Si
Liu CS, Chen LJ
Thin Solid Films, 262(1-2), 187, 1995
6 Thermal-Stability of Cu/CoSi2 Contacted P+n Shallow Junction with and Without TiW Diffusion Barrier
Chiou JC, Chen MC
Journal of the Electrochemical Society, 141(10), 2804, 1994