검색결과 : 5건
| No. | Article |
|---|---|
| 1 |
Systematic differences among nominal reference dielectric function spectra for crystalline Si as determined by spectroscopic ellipsometry Bell KA, Mantese L, Rossow U, Aspnes DE Thin Solid Films, 313-314, 161, 1998 |
| 2 |
Present status and capabilities for the theoretical calculation of surface optical properties Del Sole R Thin Solid Films, 313-314, 527, 1998 |
| 3 |
Surface and Interface Effects on Ellipsometric Spectra of Crystalline Si Bell KA, Mantese L, Rossow U, Aspnes DE Journal of Vacuum Science & Technology B, 15(4), 1205, 1997 |
| 4 |
Reflectance Anisotropy Spectroscopy - A Probe for Surface-Chemistry on Na2S-Passivated and (NH4)(2)S-Passivated (001) GaAs Paget D, Berkovits VL, Gusev AO Journal of Vacuum Science & Technology A, 13(5), 2368, 1995 |
| 5 |
Optical Anisotropy of Singular and Vicinal Si-SiO2 Interfaces and H-Terminated Si Surfaces Yasuda T, Aspnes DE, Lee DR, Bjorkman CH, Lucovsky G Journal of Vacuum Science & Technology A, 12(4), 1152, 1994 |