검색결과 : 5건
| No. | Article |
|---|---|
| 1 |
Fabrication and characterization of organic semiconductor-based microcavities Masenelli B, Callard S, Gagnaire A, Joseph J Thin Solid Films, 364(1-2), 264, 2000 |
| 2 |
Characterization of graded refractive index silicon oxynitride thin films by spectroscopic ellipsometry Callard S, Gagnaire A, Joseph J Thin Solid Films, 313-314, 384, 1998 |
| 3 |
Adapted wavelength methods for in situ ellipsometry Callard S, Gagnaire A, Besland MP, Joseph J Thin Solid Films, 313-314, 479, 1998 |
| 4 |
In-Situ Photoluminescence Control During Fabrication of SiO2/InP Structures Lambrinos MF, Besland MP, Gagnaire A, Louis P, Callard S, Joseph J Journal of the Electrochemical Society, 144(6), 2086, 1997 |
| 5 |
Fabrication and Characterization of Graded Refractive-Index Silicon Oxynitride Thin-Films Callard S, Gagnaire A, Joseph J Journal of Vacuum Science & Technology A, 15(4), 2088, 1997 |