검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Scanning spreading resistance microscopy and spectroscopy for routine and quantitative two-dimensional carrier profiling Eyben P, Xu M, Duhayon N, Clarysse T, Callewaert S, Vandervorst W Journal of Vacuum Science & Technology B, 20(1), 471, 2002 |