화학공학소재연구정보센터
검색결과 : 13건
No. Article
1 Atomic Layer Deposition of L-Alanine Polypeptide
Fu Y, Li BS, Jiang YB, Dunphy DR, Tsai A, Tam SY, Fan HY, Zhang HX, Rogers D, Rempe S, Atanassov P, Cecchi JL, Brinker CJ
Journal of the American Chemical Society, 136(45), 15821, 2014
2 Sub-10 nm thick microporous membranes made by plasma-defined atomic layer deposition of a bridged silsesquioxane precursor
Jiang YB, Xomeritakis G, Chen Z, Dunphy D, Kissel DJ, Cecchi JL, Brinkertt CJ
Journal of the American Chemical Society, 129(50), 15446, 2007
3 Nanometer-thick conformal pore sealing of self-assembled mesoporous silica by plasma-assisted atomic layer deposition
Jiang YB, Liu NG, Gerung H, Cecchi JL, Brinker CJ
Journal of the American Chemical Society, 128(34), 11018, 2006
4 Plasma science and technology: 50 years of progress
Cecchi JL, Cecchi LM
Journal of Vacuum Science & Technology A, 21(5S), S129, 2003
5 Diode laser measurements of CFx species in a low-pressure, high-density plasma reactor
Littau ME, Sowa MJ, Cecchi JL
Journal of Vacuum Science & Technology A, 20(5), 1603, 2002
6 Response surface modeling of the composition of AlAsySb1-y alloys grown by molecular beam epitaxy
Gopaladasu P, Cecchi JL, Malloy KJ, Kaspi R
Journal of Crystal Growth, 225(2-4), 556, 2001
7 Fluorocarbon polymer deposition kinetics in a low-pressure, high density, inductively coupled plasma reactor
Sowa MJ, Littau ME, Pohray V, Cecchi JL
Journal of Vacuum Science & Technology A, 18(5), 2122, 2000
8 Investigation of the kinetics of tungsten chemical mechanical polishing in potassium iodate-based slurries - I. Role of alumina and potassium iodate
Stein DJ, Hetherington DL, Cecchi JL
Journal of the Electrochemical Society, 146(1), 376, 1999
9 Investigation of the kinetics of tungsten chemical mechanical polishing in potassium iodate-based slurries II. Roles of colloid species and slurry chemistry
Stein DJ, Hetherington DL, Cecchi JL
Journal of the Electrochemical Society, 146(5), 1934, 1999
10 In situ electrochemical investigation of tungsten electrochemical behavior during chemical mechanical polishing
Stein DJ, Hetherington D, Guilinger T, Cecchi JL
Journal of the Electrochemical Society, 145(9), 3190, 1998