검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Electrostatic Coupling and Identification of Single-Defects in GaN/AlGaN Fin-MIS-HEMTs Grill A, Stampfer B, Im KS, Lee JH, Ostermaier C, Ceric H, Waltl M, Grasser T Solid-State Electronics, 156, 41, 2019 |
| 2 |
The role of cold carriers and the multiple-carrier process of Si-H bond dissociation for hot-carrier degradation in n- and p-channel LDMOS devices Sharma P, Tyaginov S, Jech M, Wimmer Y, Rudolf F, Enichlmair H, Park JM, Ceric H, Grasser T Solid-State Electronics, 115, 185, 2016 |