검색결과 : 2건
No. | Article |
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1 |
SIMS-AMS depth profiles for NASA Genesis samples: Preliminary measurements Cetina C, Grabowski KS, Knies DL, Demoranville LT Applied Surface Science, 255(4), 1479, 2008 |
2 |
Implementing a SIMS ion source on the NRL trace element accelerator mass spectrometer Knies DL, Grabowski KS, Cetina C Applied Surface Science, 252(19), 7297, 2006 |