검색결과 : 6건
| No. | Article |
|---|---|
| 1 |
Long-term reproducibility of relative sensitivity factors obtained with CAMECA Wf Gui D, Xing ZX, Huang YH, Mo ZQ, Hua YN, Zhao SP, Cha LZ Applied Surface Science, 255(4), 1427, 2008 |
| 2 |
Roughness development in the depth profiling with 500 eV O-2(+) beam with the combination of oxygen flooding and sample rotation Gui D, Xing ZX, Huang YH, Mo ZQ, Hua YN, Zhao SP, Cha LZ Applied Surface Science, 255(4), 1433, 2008 |
| 3 |
Depth profiling of ultra-thin oxynitride gate dielectrics by using MCs2+ technique Gui D, Mo ZQ, Xing ZX, Huang YH, Hua YN, Zhao SP, Cha LZ Applied Surface Science, 255(4), 1437, 2008 |
| 4 |
Ultrasensitive leak detection during ultrahigh vacuum evacuation by quadrupole mass spectrometer Chen X, Huang TB, Wang LG, Jin QJ, Cha LZ Journal of Vacuum Science & Technology A, 24(1), 91, 2006 |
| 5 |
Improvement of materials surface properties by rf glow discharge treatment Huang TB, Chen X, Tian XQ, Cha LZ Journal of Vacuum Science & Technology A, 24(4), 1568, 2006 |
| 6 |
TOF-SIMS depth profiling of SIMON Ge X, Gui D, Chen X, Cha LZ, Brox O, Benninghoven A Applied Surface Science, 203, 441, 2003 |