검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Depth profile characterization of low-energy B+- and Ge+-ion-implanted Si Karmakov I, Chakarov I, Konova A Applied Surface Science, 211(1-4), 270, 2003 |
| 2 |
Segregation of gallium at SiO2/Si interfaces during sputtering with Ga+ ions: experimental and computer simulation study Ignatova V, Chakarov I, Torrisi A, Licciardello A Applied Surface Science, 187(1-2), 145, 2002 |