검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Reliability improvement in GaN HEMT power device using a field plate approach Wu WH, Lin YC, Chin PC, Hsu CC, Lee JH, Liu SC, Maa JS, Iwai H, Chang EY, Hsu HT Solid-State Electronics, 133, 64, 2017 |
| No. | Article |
|---|---|
| 1 |
Reliability improvement in GaN HEMT power device using a field plate approach Wu WH, Lin YC, Chin PC, Hsu CC, Lee JH, Liu SC, Maa JS, Iwai H, Chang EY, Hsu HT Solid-State Electronics, 133, 64, 2017 |