검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Negative cesium sputter ion source for generating cluster primary ion beams for secondary ion mass spectrometry analysis Gillen G, King L, Freibaum B, Lareau R, Bennett J, Chmara F Journal of Vacuum Science & Technology A, 19(2), 568, 2001 |
| 2 |
Development of a triplasmatron ion source for the generation of SF5+ and F- primary ion beams on an ion microscope secondary ion mass spectrometry instrument Gillen G, King RL, Chmara F Journal of Vacuum Science & Technology A, 17(3), 845, 1999 |