화학공학소재연구정보센터
검색결과 : 11건
No. Article
1 Enhanced antimicrobial activity with faceted silver nanostructures
Rojas-Andrade M, Cho AT, Hu PG, Lee SJ, Deming CP, Sweeney SW, Saltikov C, Chen SW
Journal of Materials Science, 50(7), 2849, 2015
2 Effect of trimethylsilylation on the film stress of mesoporous silica ultralow-k film stacks
Chen JY, Pan FM, Lin DX, Cho AT, Chao KJ, Chang L
Electrochemical and Solid State Letters, 9(6), G215, 2006
3 Emission of bright blue light from mesoporous silica with dense Si (Ge) nanocrystals
Cho AT, Shieh JM, Shieh J, Lai YF, Dai BT, Pan FM, Kuo HC, Lin YC, Chao KJ, Liu PH
Electrochemical and Solid State Letters, 8(6), G143, 2005
4 Thermal stability of trimethylsilylated mesoporous silica thin films as the ultralow-k dielectric for copper interconnects
Chen JY, Pan FM, Chang L, Cho AT, Chao KJ
Journal of Vacuum Science & Technology B, 23(5), 2034, 2005
5 The preparation of mesoporous silica ultra-low-k film using ozone ashing treatment
Cho AT, Pan FM, Chao KJ, Liu PH, Chen JY
Thin Solid Films, 483(1-2), 283, 2005
6 Stable blue luminescence from mesoporous silica films
Shieh JM, Cho AT, Lai YF, Dai BT, Pan FM, Chao KJ
Electrochemical and Solid State Letters, 7(12), G319, 2004
7 Alkylation of nanoporous silica thin films by high density plasma chemical vapor deposition of a-SIC : H
Pan FM, Wu BW, Cho AT, Tsai KC, Tsai TG, Chao KJ, Chen JY, Chang L
Journal of Vacuum Science & Technology B, 22(3), 1067, 2004
8 Microstructure and mechanical properties of surfactant templated nanoporous silica thin films: Effect of methylsilylation
Chen JY, Pan FM, Cho AT, Chao KJ, Tsai TG, Wu BW, Yang CM, Chang L
Journal of the Electrochemical Society, 150(6), F123, 2003
9 Formation and microstructure of mesoporous silica films with ultralow dielectric constants
Tsai TG, Cho AT, Yang CM, Pan FM, Chao KJ
Journal of the Electrochemical Society, 149(9), F116, 2002
10 Spin-on mesoporous silica films with ultralow dielectric constants, ordered pore structures, and hydrophobic surfaces
Yang CM, Cho AT, Pan FM, Tsai TG, Chao KJ
Advanced Materials, 13(14), 1099, 2001