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| No. | Article |
|---|---|
| 1 |
Use of XPS to clarify the Hall coefficient sign variation in thin niobium layers buried in silicon Demchenko IN, Lisowski W, Syryanyy Y, Melikhov Y, Zaytseva I, Konstantynov P, Chernyshova M, Cieplak MZ Applied Surface Science, 399, 32, 2017 |