화학공학소재연구정보센터
검색결과 : 2건
No. Article
1 Structural investigation of CoMnGe combinatorial epitaxial thin films using microfocused synchrotron X-ray
Chu YS, Tkachuk A, Vogt S, Ilinski P, Walko DA, Mancini DC, Dufresne EM, He L, Tsui F
Applied Surface Science, 223(1-3), 175, 2004
2 Composition characterization of combinatorial materials by scanning X-ray fluorescence microscopy using microfocused synchrotron X-ray beam
Vogt S, Chu YS, Tkachuk A, Ilinski P, Walko DA, Tsui F
Applied Surface Science, 223(1-3), 214, 2004