검색결과 : 9건
No. | Article |
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1 |
Electrodeposition of Epitaxial Co on Ru(0001)/Al2O3(0001) Gusley R, Sentosun K, Ezzat S, Coffey KR, West AC, Barmak K Journal of the Electrochemical Society, 166(15), D875, 2019 |
2 |
The grain boundary character distribution of highly twinned nanocrystalline thin film aluminum compared to bulk microcrystalline aluminum Rohrer GS, Liu X, Liu JX, Darbal A, Kelly MN, Chen XW, Berkson MA, Nuhfer NT, Coffey KR, Barmak K Journal of Materials Science, 52(16), 9819, 2017 |
3 |
Ionic conductivity of bias sputtered lithium phosphorus oxy-nitride thin films Mani PD, Saraf S, Singh V, Real-Robert M, Vijayakumar A, Duranceau SJ, Seal S, Coffey KR Solid State Ionics, 287, 48, 2016 |
4 |
Grain growth and the puzzle of its stagnation in thin films: The curious tale of a tail and an ear Barmak K, Eggeling E, Kinderlehrer D, Sharp R, Ta'asan S, Rollett AD, Coffey KR PROGRESS IN MATERIALS SCIENCE, 58(7), 987, 2013 |
5 |
Classical size effect in oxide-encapsulated Cu thin films: Impact of grain boundaries versus surfaces on resistivity Sun T, Yao B, Warren AP, Kumar V, Roberts S, Barmak K, Coffey KR Journal of Vacuum Science & Technology A, 26(4), 605, 2008 |
6 |
On the phase identification of dc magnetron sputtered Pt-Ru alloy thin films Warren AP, Todi RM, Yao B, Barmak K, Sundaram KB, Coffey KR Journal of Vacuum Science & Technology A, 26(5), 1208, 2008 |
7 |
X-ray photoelectron spectroscopy analysis of oxygen annealed radio frequency sputter deposited SiCN thin films Todi RM, Warren AP, Sundaram KB, Coffey KR Journal of the Electrochemical Society, 153(7), G640, 2006 |
8 |
Comparison of the agglomeration behavior of thin metallic films on SiO2 Gadkari PR, Warren AP, Todi RM, Petrova RV, Coffey KR Journal of Vacuum Science & Technology A, 23(4), 1152, 2005 |
9 |
Measurement of carbon film thickness by inelastic electron scatter Bryson CE, Vasilyev L, Linder R, White RL, Thiele JU, Coffey KR, Brannon JH Journal of Vacuum Science & Technology A, 19(5), 2695, 2001 |