화학공학소재연구정보센터
검색결과 : 9건
No. Article
1 Electrodeposition of Epitaxial Co on Ru(0001)/Al2O3(0001)
Gusley R, Sentosun K, Ezzat S, Coffey KR, West AC, Barmak K
Journal of the Electrochemical Society, 166(15), D875, 2019
2 The grain boundary character distribution of highly twinned nanocrystalline thin film aluminum compared to bulk microcrystalline aluminum
Rohrer GS, Liu X, Liu JX, Darbal A, Kelly MN, Chen XW, Berkson MA, Nuhfer NT, Coffey KR, Barmak K
Journal of Materials Science, 52(16), 9819, 2017
3 Ionic conductivity of bias sputtered lithium phosphorus oxy-nitride thin films
Mani PD, Saraf S, Singh V, Real-Robert M, Vijayakumar A, Duranceau SJ, Seal S, Coffey KR
Solid State Ionics, 287, 48, 2016
4 Grain growth and the puzzle of its stagnation in thin films: The curious tale of a tail and an ear
Barmak K, Eggeling E, Kinderlehrer D, Sharp R, Ta'asan S, Rollett AD, Coffey KR
PROGRESS IN MATERIALS SCIENCE, 58(7), 987, 2013
5 Classical size effect in oxide-encapsulated Cu thin films: Impact of grain boundaries versus surfaces on resistivity
Sun T, Yao B, Warren AP, Kumar V, Roberts S, Barmak K, Coffey KR
Journal of Vacuum Science & Technology A, 26(4), 605, 2008
6 On the phase identification of dc magnetron sputtered Pt-Ru alloy thin films
Warren AP, Todi RM, Yao B, Barmak K, Sundaram KB, Coffey KR
Journal of Vacuum Science & Technology A, 26(5), 1208, 2008
7 X-ray photoelectron spectroscopy analysis of oxygen annealed radio frequency sputter deposited SiCN thin films
Todi RM, Warren AP, Sundaram KB, Coffey KR
Journal of the Electrochemical Society, 153(7), G640, 2006
8 Comparison of the agglomeration behavior of thin metallic films on SiO2
Gadkari PR, Warren AP, Todi RM, Petrova RV, Coffey KR
Journal of Vacuum Science & Technology A, 23(4), 1152, 2005
9 Measurement of carbon film thickness by inelastic electron scatter
Bryson CE, Vasilyev L, Linder R, White RL, Thiele JU, Coffey KR, Brannon JH
Journal of Vacuum Science & Technology A, 19(5), 2695, 2001