검색결과 : 21건
| No. | Article |
|---|---|
| 1 |
Useful vacancies: Positron beam interrogation of fluorine-vacancy complexes in semiconductor device structures Coleman PG, Abdulmalik DA Applied Surface Science, 255(1), 71, 2008 |
| 2 |
Modification of silicon waveguide structures using ion implantation induced defects Knights AP, Dudeck KJ, Walters WD, Coleman PG Applied Surface Science, 255(1), 75, 2008 |
| 3 |
Back to the future: Polarised positron beams Coleman PG, Potter NR Applied Surface Science, 255(1), 101, 2008 |
| 4 |
Leakage current and charge trapping behavior in TiO2/SiO2 high-kappa gate dielectric stack on 4H-SIC substrate Mahapatra R, Chakraborty AK, Poolamai N, Horsfall A, Chattopadhyay S, Wright NG, Coleman KS, Coleman PG, Burrows CP Journal of Vacuum Science & Technology B, 25(1), 217, 2007 |
| 5 |
Real-time full spectrum fitting of beam-based Doppler broadening data Coleman PG, Burrows CP, Mason RE Applied Surface Science, 252(9), 3183, 2006 |
| 6 |
Self-implantation of Cz-Si: Clustering and annealing of defects Abdulmalik DA, Coleman PG, Al-Qaradawi IY Applied Surface Science, 252(9), 3209, 2006 |
| 7 |
A technique for positron spectroscopy of monovacancies formed by low-temperature ion implantation of silicon Mason RE, Coleman PG Applied Surface Science, 252(9), 3228, 2006 |
| 8 |
Characterization of a SiC/SiC composite by X-ray diffraction, atomic force microscopy and positron spectroscopies Brauer G, Anwand W, Eichhorn F, Skorupa W, Hofer C, Teichert C, Kuriplach J, Cizek J, Prochazka I, Coleman PG, Nozawa T, Kohyama A Applied Surface Science, 252(9), 3342, 2006 |
| 9 |
Positron beam studies of solids and surfaces: A summary Coleman PG Applied Surface Science, 252(9), 3372, 2006 |
| 10 |
Nanocrystalline Si studied by beam-based positron annihilation spectroscopy Coleman PG, Pi XD, Gwilliam RM, Sealy BJ Materials Science Forum, 445-6, 66, 2004 |