화학공학소재연구정보센터
검색결과 : 4건
No. Article
1 Thickness determination of SrZrO3 thin films using both X-ray reflectometry and SIMS techniques
Galicka-Fau K, Legros C, Andrieux M, Herbst-Ghysel M, Gallet I, Condat M, Durand O, Servet B
Thin Solid Films, 516(22), 7967, 2008
2 Perovskite thin films grown by direct liquid injection MOCVD
Andrieux M, Gasqueres C, Legros C, Gallet I, Herbst-Ghysel M, Condat M, Kessler VG, Seisenbaeva GA, Heintz O, Poissonnet S
Applied Surface Science, 253(23), 9091, 2007
3 Dual-source chemical vapour deposition of strontium and zirconium beta-diketonates for strontium zirconate perovskite films
Andrieux M, Viallet V, Le Stum M, Rapenne L, Ghysel M, Haut C, Condat M
Applied Surface Science, 222(1-4), 351, 2004
4 Deflection and three point bending tests in SEM: Mechanical characteristics of oxide films
Huntz AM, Andrieux M, Sattonnay G, Condat M
Materials Science Forum, 461-464, 713, 2004