검색결과 : 4건
| No. | Article |
|---|---|
| 1 |
Stability and high-frequency operation of amorphous In-Ga-Zn-O thin-film transistors with various passivation layers Nomura K, Kamiya T, Hosono H Thin Solid Films, 520(10), 3778, 2012 |
| 2 |
Comprehensive studies on the stabilities of a-In-Ga-Zn-O based thin film transistor by constant current stress Nomura K, Kamiya T, Kikuchi Y, Hirano M, Hosono H Thin Solid Films, 518(11), 3012, 2010 |
| 3 |
Stress-induced leakage currents of the RF sputtered Ta2O5 on N-implanted silicon Novkovski N, Atanassova E, Paskaleva A Applied Surface Science, 253(9), 4396, 2007 |
| 4 |
Soft breakdown current noise in ultra-thin gate oxides Cester A, Bandiera L, Ghidini G, Bloom I, Paccagnella A Solid-State Electronics, 46(7), 1019, 2002 |