검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Optical constants and interband transitions of Ge1-xSnx alloys (x < 0.2) grown on Si by UHV-CVD Cook CS, Zollner S, Bauer MR, Aella P, Kouvetakis J, Menendez J Thin Solid Films, 455-56, 217, 2004 |
| 2 |
Gate oxide metrology and silicon piezooptics Zollner S, Liu R, Volinsky AA, White T, Nguyen BY, Cook CS Thin Solid Films, 455-56, 261, 2004 |
| 3 |
Spectroscopic ellipsometry for in-line monitoring of silicon nitrides Cook CS, Daly T, Liu R, Canonico M, Xie Q, Gregory RB, Zollner S Thin Solid Films, 455-56, 794, 2004 |