검색결과 : 12건
| No. | Article |
|---|---|
| 1 |
Development of a carbonate crust on alkaline nuclear waste sludge at the Hanford site Page JS, Reynolds JG, Ely TM, Cooke GA Journal of Hazardous Materials, 342, 375, 2018 |
| 2 |
Solid-phase zirconium and fluoride species in alkaline zircaloy cladding waste at Hanford Reynolds JG, Huber HJ, Cooke GA, Pestovich JA Journal of Hazardous Materials, 278, 203, 2014 |
| 3 |
Salt Mineralogy of Hanford High-Level Nuclear Waste Staged for Treatment Reynolds JG, Cooke GA, Herting DL, Warrant RW Industrial & Engineering Chemistry Research, 52(29), 9741, 2013 |
| 4 |
Evidence for dawsonite in Hanford high-level nuclear waste tanks Reynolds JG, Cooke GA, Herting DL, Warrant RW Journal of Hazardous Materials, 209, 186, 2012 |
| 5 |
Charge compensation using optical conductivity enhancement and simple analytical protocols for SIMS of resistive Si1-xGex alloy layers Dowsett MG, Morris R, Chou PF, Corcoran SF, Kheyrandish H, Cooke GA, Maul JL, Patel SB Applied Surface Science, 203, 500, 2003 |
| 6 |
Use of two beam energies in secondary ion mass spectrometry analysis of shallow implants: Resolution-matched profiling Cooke GA, Ormsby TJ, Dowsett MG, Parry C, Murrell A, Collart EJH Journal of Vacuum Science & Technology B, 18(1), 493, 2000 |
| 7 |
Ultra low energy SIMS, XTEM and X-ray diffraction methods for the characterization of a MBE grown short period (SinGem)(16) superlattices Mironov OA, Fulgoni DJF, Parry CP, Cooke GA, Dowsett MG, Parker EHC, Chtcherbatchev KD, Bassas JM, Romano-Rodriguez A, Perez-Rodriguez A, Morante JR Thin Solid Films, 367(1-2), 176, 2000 |
| 8 |
Ultralow energy secondary ion mass spectrometry and transient yields at the silicon surface Dowsett MG, Ormsby TJ, Cooke GA, Chu DP Journal of Vacuum Science & Technology B, 16(1), 302, 1998 |
| 9 |
Use of Maximum-Entropy Deconvolution for the Study of Silicon Delta-Layers in GaAs Cooke GA, Dowsett MG, Allen PN, Collins R, Miethe K Journal of Vacuum Science & Technology B, 14(1), 132, 1996 |
| 10 |
Experimental Investigation of the Increase in-Depth Resolution Obtained Through the Use of Maximum-Entropy Deconvolution of Secondary-Ion Mass-Spectrometry Depth Profiles Cooke GA, Dowsett MG, Phillips P Journal of Vacuum Science & Technology B, 14(1), 283, 1996 |