검색결과 : 2건
No. | Article |
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1 |
Surface chemical state analysis of electroplated Cu film under, Cu-CMP process by means of TOF-SIMS Miyoshi H, Saito R, Kudo M Applied Surface Science, 203, 473, 2003 |
2 |
Copper dry etching with Cl-2/Ar plasma chemistry Lee JW, Park YD, Childress JR, Pearton SJ, Sharifi F, Ren F Journal of the Electrochemical Society, 145(7), 2585, 1998 |