화학공학소재연구정보센터
검색결과 : 9건
No. Article
1 Scanning tunneling microscopy of endohedral metallofullerene Lu-C-82 on C-60 film
Shi BR, Wang XS, Huang HJ, Yang SH, Bachmann A, Cue N
Journal of Vacuum Science & Technology B, 20(6), 2388, 2002
2 Self-assembled growth of cubic silicon carbide nano-islands on silicon
Yang JS, Wang X, Zhai GJ, Cue N, Wang X
Journal of Crystal Growth, 224(1-2), 83, 2001
3 Scanning tunneling microscopy of endohedral metallofullerene Tb@C-82 on C-60 film and Si(100) 2 x 1 surface
Shi BR, Wang XS, Huang HJ, Yang SH, Heiland W, Cue N
Journal of Physical Chemistry B, 105(46), 11414, 2001
4 Waveguide structure of Er-doped KTiOPO4 films on different substrates by pulsed-laser deposition
Wang KM, Shi BR, Cue N, Zhu YY, Xiao RF, Lu F, Hu H, Liu YG
Journal of Vacuum Science & Technology A, 19(2), 394, 2001
5 Surface structures of silicon nitride thin films on Si(111)
Zhai GJ, Yang JS, Cue N, Wang XS
Thin Solid Films, 366(1-2), 121, 2000
6 Scanning tunneling microscopy of ring-shape endohedral metallofullerene (Nd@C-82)(6,12) clusters
Lin N, Huang HJ, Yang SH, Cue N
Journal of Physical Chemistry A, 102(24), 4411, 1998
7 Growth of Gallium Nitride Thin-Films by Liquid-Target Pulsed-Laser Deposition
Xiao RF, Sun XW, Li ZF, Cue N, Kwok HS, Liu QZ, Lau SS
Journal of Vacuum Science & Technology A, 15(4), 2207, 1997
8 Deconvolution of the Gaussian-Convoluted Profiles of Mercury Ions Implanted into Nickel
Shi BR, Cue N, Wang KM
Journal of Vacuum Science & Technology A, 15(6), 3115, 1997
9 Lateral Range Spread of MeV Phosphorus Ions Implanted in Silicon Measured by Time-of-Flight Secondary-Ion Mass-Spectrometry
Shi BR, Cue N, Smith TL, Xu TB
Journal of Vacuum Science & Technology B, 15(2), 273, 1997