| 1 |
Lattice resolved annular dark-field scanning transmission electron microscopy of (Al, In)GaN/GaN layers for measuring segregation with sub-monolayer precision
Walther T, Amari H, Ross IM, Wang T, Cullis AG
Journal of Materials Science, 48(7), 2883, 2013 |
| 2 |
Bi incorporation in GaAs(100)-2 x 1 and 4 x 3 reconstructions investigated by RHEED and STM
Bastiman F, Cullis AG, David JPR, Sweeney SJ
Journal of Crystal Growth, 341(1), 19, 2012 |
| 3 |
GaAs(001) planarization after conventional oxide removal utilising self-governed InAs QD site selection
Bastiman F, Cullis AG
Applied Surface Science, 256(13), 4269, 2010 |
| 4 |
Ga assisted oxide desorption on GaAs(001) studied by scanning tunnelling microscopy
Bastiman F, Lin JC, Cullis AG, Hogg R, Skolnick M
Journal of Crystal Growth, 312(10), 1687, 2010 |
| 5 |
Two step optimized process for scanning tunneling microscopy tip fabrication
Bastiman F, Cullis AG, Hopkinson M, Briston KJ
Journal of Vacuum Science & Technology B, 28(2), 371, 2010 |
| 6 |
As-rich reconstruction stability observed by high temperature scanning tunnelling microscopy
Bastiman F, Cullis AG, Hopkinson M
Journal of Crystal Growth, 311(20), 4478, 2009 |
| 7 |
Low temperature electrical characterisation of tungsten nano-wires fabricated by electron and ion beam induced chemical vapour deposition
Luxmoore IJ, Ross IM, Cullis AG, Fry PW, Orr J, Buckle PD, Jefferson JH
Thin Solid Films, 515(17), 6791, 2007 |
| 8 |
Spontaneous emission control in micropillar cavities containing a fluorescent molecular dye
Adawi AM, Cadby A, Connolly LG, Hung WC, Dean R, Tahraoui A, Fox AM, Cullis AG, Sanvitto D, Skolnick MS, Lidzey DG
Advanced Materials, 18(6), 742, 2006 |
| 9 |
V-shaped pits formed at the GaN/AlN interface
Bai J, Wang T, Parbrook PJ, Ross IM, Cullis AG
Journal of Crystal Growth, 289(1), 63, 2006 |
| 10 |
The impact of non-uniform channel layer growth on device characteristics in state of the Art Si/SiGe/Si p-metal oxide semiconductor field effect transistors
Chang ACK, Ross IM, Norris DJ, Cullis AG, Tang YT, Cerrina C, Evans AGR
Thin Solid Films, 496(2), 306, 2006 |
