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Applied Surface Science, 252(19), 6731, 2006 |
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An X-ray diffraction method to determine stress at constant penetration/information depth
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Materials Science Forum, 524-525, 13, 2006 |
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Mechanical stress gradients in thin films analyzed employing X-ray diffraction measurements at constant penetration/information depths
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Materials Science Forum, 524-525, 19, 2006 |
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Surface Nanostructure Determination by X-Ray Photoemission Spectroscopy Peak Shape-Analysis
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Journal of Vacuum Science & Technology A, 14(3), 1415, 1996 |
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Applicability of the Tougaard Ratio-D in the Analysis of Nanometric TiO2 Overlayers
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