검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Determination of parameters of radiation induced traps in silicon Siemieniec R, Sudkamp W, Lutz J Solid-State Electronics, 46(6), 891, 2002 |
| 2 |
On the determination of interface state density in n-InP Schottky structures by current-voltage measurements - Comparison with DLTS results Ahaitouf A, Losson E, Bath A Solid-State Electronics, 44(3), 515, 2000 |