화학공학소재연구정보센터
검색결과 : 16건
No. Article
1 Ab initio calculations and rate equation simulations for vacancy and vacancy-oxygen clustering in silicon
Kissinger G, Dabrowski J, Sinno T, Yang Y, Kot D, Sattler A
Journal of Crystal Growth, 468, 424, 2017
2 A manufacturable process integration approach for graphene devices
Vaziri S, Lupina G, Paussa A, Smith AD, Henkel C, Lippert G, Dabrowski J, Mehr W, Ostling M, Lemme MC
Solid-State Electronics, 84, 185, 2013
3 Modeling the Early Stages of Oxygen Agglomeration
Kissinger G, Dabrowski J, Kot D, Akhmetov V, Sattler A, von Ammon W
Journal of the Electrochemical Society, 158(4), H343, 2011
4 Papers from the 15th Workshop on Dielectrics in Microelectronics PREFACE
Mussing HJ, Schroeder T, Dabrowski J
Journal of Vacuum Science & Technology B, 27(1), 208, 2009
5 On the band gaps and electronic structure of thin single crystalline praseodymium oxide layers on Si(111)
Seifarth O, Dabrowski J, Zaumseil P, Muller S, Schmeisser D, Mussig HJ, Schroeder T
Journal of Vacuum Science & Technology B, 27(1), 271, 2009
6 Morphology and composition of selected high-k materials and their relevance to dielectric properties of thin films
Dabrowski J, Lippert G, Oberbeck L, Schroder U, Costina I, Lupina G, Ratzke M, Zaumseil P, Muessig HJ
Journal of the Electrochemical Society, 155(5), G97, 2008
7 Oxide precipitation via coherent seed-oxide phases
Kissinger G, Dabrowski J
Journal of the Electrochemical Society, 155(6), H448, 2008
8 Analytical modeling of the interaction of vacancies and oxygen for oxide precipitation in RTA treated silicon wafers
Kissinger G, Dabrowski J, Sattler A, Seuring C, Muller T, Richter H, von Ammon W
Journal of the Electrochemical Society, 154(6), H454, 2007
9 Barrier to rotation around the C-sp(2)-C-sp(2) bond of the ketoaldehyde enol ether MeC(O)CH=CH-OEt as determined by C-13 NMR and ab initio calculations
Siebert HC, Tajkhorshid E, Dabrowski J
Journal of Physical Chemistry A, 105(37), 8488, 2001
10 Formation of atomically smooth, ultrathin oxides on Si(113)
Mussig HJ, Dabrowski J, Hinrich S
Solid-State Electronics, 45(8), 1219, 2001