검색결과 : 2건
No. | Article |
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1 |
Photoconductivity characterization of silicon wafer mirror-polishing subsurface damage related to gate oxide integrity Ogita Y, Kobayashi K, Daio H Journal of Crystal Growth, 210(1-3), 36, 2000 |
2 |
Lifetime Study of Metastable Surface Recombination Centers in N-Type Silicon-Wafers Daio H, Buczkowski A, Shimura F Journal of the Electrochemical Society, 141(6), 1590, 1994 |