화학공학소재연구정보센터
검색결과 : 8건
No. Article
1 An Efficient Light-Driven P450 BM3 Biocatalyst
Tran NH, Nguyen D, Dwaraknath S, Mahadevan S, Chavez G, Nguyen A, Dao T, Mullen S, Nguyen TA, Cheruzel LE
Journal of the American Chemical Society, 135(39), 14484, 2013
2 Use of the Weibull model to describe inactivation of dry-harvested conidia of different Penicillium species by ethanol vapours
Dao T, Dejardin J, Bensoussan M, Dantigny P
Journal of Applied Microbiology, 109(2), 408, 2010
3 Impurity redistribution due to recrystallization of preamorphized silicon
Duffy R, Venezia VC, van der Tak K, Hopstaken MJP, Maas GCJ, Roozeboom F, Tamminga Y, Dao T
Journal of Vacuum Science & Technology B, 23(5), 2021, 2005
4 HfSiO4 dielectric layers deposited by ALD using HfCl4 and NH2(CH2)(3)Si(OC2H5)(3) precursors
Rittersma ZM, Roozeboom F, Verheijen MA, van Berkum JGM, Dao T, Snijders JHM, Vainonen-Ahlgren E, Tois E, Tuominen M, Haukka S
Journal of the Electrochemical Society, 151(11), C716, 2004
5 Influence of preamorphization and recrystallization on indium doping profiles in silicon
Duffy R, Venezia VC, Heringa A, Pawlak BJ, Hopstaken MJP, Tamminga Y, Dao T, Roozeboom F, Wang CC, Diaz CH, Griffin PB
Journal of Vacuum Science & Technology B, 22(3), 865, 2004
6 Physical and electrical properties of Zr-silicate dielectric layers deposited by atomic layer deposition
Rittersma ZM, Naburgh E, Dao T, Hendriks AHC, Besling WFA, Tois E, Vainonen-Ahlgren E, Tuominen M, Haukka S
Electrochemical and Solid State Letters, 6(7), F21, 2003
7 Model of hydrogen permeation behavior in palladium membranes
Ward TL, Dao T
Journal of Membrane Science, 153(2), 211, 1999
8 Comparison of Damage Created by a Chemical Downstream Etcher and Plasma-Immersion System in Metal-Oxide-Semiconductor Capacitors
Brozek T, Dao T, Viswanathan CR
Journal of Vacuum Science & Technology B, 14(1), 577, 1996