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| No. | Article |
|---|---|
| 1 |
Real time in situ composition control of InGaAs lattice matched to InP by an 88-wavelength ellipsometer Kuo CH, Boonzaayer M, DeHerrera M, Kyong T, Zhang YH, Johs B, Hale JS Journal of Vacuum Science & Technology B, 16(3), 1484, 1998 |