검색결과 : 5건
| No. | Article |
|---|---|
| 1 |
Ionization-induced annealing in silicon upon dual-beam irradiation Thome L, Gutierrez G, Monnet I, Garrido F, Debelle A Journal of Materials Science, 55(14), 5938, 2020 |
| 2 |
Study of the initial stages of defect generation in ion-irradiated MgO at elevated temperatures using high-resolution X-ray diffraction Bachiller-Perea D, Debelle A, Thome L, Crocombette JP Journal of Materials Science, 51(3), 1456, 2016 |
| 3 |
Strain and stress build-up in He-implanted UO2 single crystals: an X-ray diffraction study Debelle A, Boulle A, Garrido F, Thome L Journal of Materials Science, 46(13), 4683, 2011 |
| 4 |
Reactive magnetron cosputtering of hard and conductive ternary nitride thin films: Ti-Zr-N and Ti-Ta-N Abadias G, Koutsokeras LE, Dub SN, Tolmachova GN, Debelle A, Sauvage T, Villechaise P Journal of Vacuum Science & Technology A, 28(4), 541, 2010 |
| 5 |
Growth stress buildup in ion beam sputtered Mo thin films and comparative study of stress relaxation upon thermal annealing or ion irradiation Debelle A, Abadias G, Michel A, Jaouen C, Pelosin V Journal of Vacuum Science & Technology A, 25(5), 1438, 2007 |