검색결과 : 2건
No. | Article |
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1 |
Electrical characterization of the A(III)B(V)-N heterostructures by capacitance methods Stuchlikova L, Harmatha L, Petrus M, Rybar J, Sebok J, Sciana B, Radziewicz D, Pucicki D, Tlaczala M, Kosa A, Benko P, Kovac J, Juhasz P Applied Surface Science, 269, 175, 2013 |
2 |
Laplace defect spectroscopy for recognition of deep-level fine structures Kang JY, Zhan HH, Huang QS Journal of Crystal Growth, 210(1-3), 247, 2000 |