화학공학소재연구정보센터
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No. Article
1 Low threading dislocation density aluminum nitride on silicon carbide through the use of reduced temperature interlayers
Foronda HM, Wu F, Zollner C, Alif ME, Saifaddin B, Almogbel A, Iza M, Nakamura S, DenBaars SP, Speck JS
Journal of Crystal Growth, 483, 134, 2018
2 N-doped Al2O3 thin films deposited by atomic layer deposition
Kim M, Kang KM, Wang Y, Park HH
Thin Solid Films, 660, 657, 2018
3 Defect reduction of SiNx embedded m-plane GaN grown by hydride vapor phase epitaxy
Woo S, Kim M, So B, Yoo G, Jang J, Lee K, Nam O
Journal of Crystal Growth, 407, 6, 2014
4 Achieving High Field-Effect Mobility in Amorphous Indium-Gallium-Zinc Oxide by Capping a Strong Reduction Layer
Zan HW, Yeh CC, Meng HF, Tsai CC, Chen LH
Advanced Materials, 24(26), 3509, 2012
5 Characterization of a-plane GaN layers grown on patterned r-sapphire substrate by metal organic chemical vapor deposition
Yoo G, Park H, Lee D, Lim H, Lee S, Kong B, Cho H, Park H, Lee H, Nam O
Current Applied Physics, 11(4), S90, 2011
6 Approach for dislocation free GaN epitaxy
Hite JK, Mastro MA, Eddy CR
Journal of Crystal Growth, 312(21), 3143, 2010
7 Progress in fabrication processing of thin film transistors
Yoshioka K, Sameshima T, Sano N
Solid-State Electronics, 52(3), 359, 2008
8 Growth evolution in sidewall lateral epitaxial overgrowth (SLEO)
Imer B, Wu F, Speck JS, DenBaars SP
Journal of Crystal Growth, 306(2), 330, 2007
9 Defect reduction in SiC crystals grown by the modified Lely method
Anikin MM, Pons M, Pernot E, Madar R
Materials Science Forum, 433-4, 83, 2002
10 Heteroepitaxy of Gap on Si(100)
Bachmann KJ, Rossow U, Sukidi N, Castleberry H, Dietz N
Journal of Vacuum Science & Technology B, 14(4), 3019, 1996