검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
SILC decay in La2O3 gate dielectrics grown on Ge substrates subjected to constant voltage stress Rahman MS, Evangelou EK, Androulidakis II, Dimoulas A, Mavrou G, Galata S Solid-State Electronics, 54(9), 979, 2010 |
| 2 |
Laser gettering of structural-impurity defects in the contacts of metal-intrinsic CdTe with a Schottky barrier Vorobets GI, Vorobets OI, Strebegev VN, Tanasyuk YV Applied Surface Science, 254(4), 942, 2007 |
| 3 |
The SiC-SiO2 interface: A unique advantage of SiC as a wide energy-gap material Dimitrijev S Materials Science Forum, 457-460, 1263, 2004 |