검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Development of nanotopography during SIMS characterization of thin films of Ge1-xSnx alloy Secchi M, Demenev E, Colaux JL, Giubertoni D, Dell'Anna R, Iacob E, Gwilliam M, Jeynes C, Bersani M Applied Surface Science, 356, 422, 2015 |
| 2 |
XPS and ToF-SIMS investigation of nanocrystalline diamond oxidized surfaces Torrengo S, Canteri R, Dell'Anna R, Minati L, Pasquarelli A, Speranza G Applied Surface Science, 276, 101, 2013 |