검색결과 : 3건
No. | Article |
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1 |
Secondary impact ionization and device aging in deep submicron MOS devices with various transistor architectures Marchand B, Cretu B, Ghibaudo G, Balestra F, Blachier D, Leroux C, Deleonibus S, Guegan G, Reimbold G, Kubicek S, DeMeyer K Solid-State Electronics, 46(3), 337, 2002 |
2 |
Proposal for a New Process Flow for the Fabrication of Silicon-Based Complementary MOD-MOSFETs Without Ion-Implantation Augusto CJ, Demeyer K Thin Solid Films, 294(1-2), 254, 1997 |
3 |
Coral-Reef Catastrophe Ogden JC, Alleng G, Menendez PA, Azueta J, Bone D, Buchan K, Bush P, Cortes J, Demeyer K, Garcia J, Garzonferreira J, Gayle P, Gerace D, Geraldes F, Dahlgren EJ, Kjerfve B, Laydoo R, Ogden J, Oxenford H, Parker C, Patt A, Penchaszadeh P, Peralta R, Pors LP, Ramirez J, Rojasgalaviz JL, Ruizrenteria F, Ryan J, Singh J, Smith SR, Tschirky J, Varela R, Wiebe W, Woodley JD, Zieman JC Science, 266(5193), 1931, 1994 |