화학공학소재연구정보센터
검색결과 : 3건
No. Article
1 Secondary impact ionization and device aging in deep submicron MOS devices with various transistor architectures
Marchand B, Cretu B, Ghibaudo G, Balestra F, Blachier D, Leroux C, Deleonibus S, Guegan G, Reimbold G, Kubicek S, DeMeyer K
Solid-State Electronics, 46(3), 337, 2002
2 Proposal for a New Process Flow for the Fabrication of Silicon-Based Complementary MOD-MOSFETs Without Ion-Implantation
Augusto CJ, Demeyer K
Thin Solid Films, 294(1-2), 254, 1997
3 Coral-Reef Catastrophe
Ogden JC, Alleng G, Menendez PA, Azueta J, Bone D, Buchan K, Bush P, Cortes J, Demeyer K, Garcia J, Garzonferreira J, Gayle P, Gerace D, Geraldes F, Dahlgren EJ, Kjerfve B, Laydoo R, Ogden J, Oxenford H, Parker C, Patt A, Penchaszadeh P, Peralta R, Pors LP, Ramirez J, Rojasgalaviz JL, Ruizrenteria F, Ryan J, Singh J, Smith SR, Tschirky J, Varela R, Wiebe W, Woodley JD, Zieman JC
Science, 266(5193), 1931, 1994