| 1 |
Molecular depth profiling of trehalose using a C-60 cluster ion beam
Wucher A, Cheng J, Winograd N
Applied Surface Science, 255(4), 959, 2008 |
| 2 |
Three-dimensional molecular imaging using mass spectrometry and atomic force microscopy
Wucher A, Cheng J, Zheng LL, Willingham D, Winograd N
Applied Surface Science, 255(4), 984, 2008 |
| 3 |
Accuracy of calibrated depth by delta-doped reference materials in shallow depth profiling
Tomita M, Tanaka H, Koike M, Kinno T, Hori Y, Yoshida N, Sasaki T, Takeno S
Applied Surface Science, 255(4), 1311, 2008 |
| 4 |
Sputtered depth scales of multi-layered samples with in situ laser interferometry: arsenic diffusion in Si/SiGe layers
Ronsheim PA, Loesing R, Madan A
Applied Surface Science, 231-2, 762, 2004 |
| 5 |
Accurate on-line depth calibration with a laser interferometer during SIMS profiling on the Cameca IMS WF instrument
Merkulov A, Merkulova O, de Chambost E, Schuhmacher M
Applied Surface Science, 231-2, 954, 2004 |
| 6 |
Depth scale calibration of SIMS depth profiles by means of an online crater depth measurement technique
De Chambost E, Monsallut P, Rasser B, Schuhmacher M
Applied Surface Science, 203, 391, 2003 |
