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SIRIUS: A new beamline for in situ X-ray diffraction and spectroscopy studies of advanced materials and nanostructures at the SOLEIL Synchrotron Ciatto G, Chu MH, Fontaine P, Aubert N, Renevier H, Deschanvres JL Thin Solid Films, 617, 48, 2016 |
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Antireflection and downconversion response of Nd3+ doped Y2O3/Si thin film deposited by AACVD process Elleuch R, Salhi R, Deschanvres JL, Maalej R Chemical Physics Letters, 612, 1, 2014 |
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In-situ Raman spectroscopy and X-ray diffraction studies of the structural transformations leading to the SrCu2O2 phase from strontium copper oxide thin films deposited by metalorganic chemical vapor deposition Khan A, Jimenez C, Chaix-Pluchery O, Roussel H, Deschanvres JL Thin Solid Films, 541, 136, 2013 |
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Effect of humidity and UV-assistance on the preparation of erbium doped alumina by aerosol MOCVD process Salhi R, Jimenez C, Chaudouet P, Maalej R, Fourati M, Deschanvres JL Applied Surface Science, 258(7), 2591, 2012 |
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Growth of amorphous Ti-Si-O thin films by aerosol CVD process at atmospheric pressure Hodroj A, Deschanvres JL, Gottlieb U Journal of the Electrochemical Society, 155(2), D110, 2008 |
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Growth and characterisation of CaCu2Ox thin films by pulsed injection MOCVD Deschanvres JL, Jimenez C, Rapenne L, McSporran N, Servet B, Durand O, Modreanu M Thin Solid Films, 516(7), 1461, 2008 |
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An RBS study of thin PLD and MOCVD strontium copper oxide layers Kantor Z, Papadopoulou EL, Aperathitis E, Deschanvres JL, Somogyi K, Szendro I Thin Solid Films, 516(22), 8136, 2008 |
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Density, thickness and composition measurements of TiO2-SiO2 thin films by coupling X-ray reflectometry, ellipsometry and electron probe microanalysis-X Hodroj A, Roussel H, Crisci A, Robaut F, Gottlieb U, Deschanvres JL Applied Surface Science, 253(1), 363, 2006 |
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Influence of physico-structural properties on the photocatalytic activity of sol-gel derived TiO2 thin films Fallet M, Permpoon S, Deschanvres JL, Langlet M Journal of Materials Science, 41(10), 2915, 2006 |