검색결과 : 11건
| No. | Article |
|---|---|
| 1 |
Spectroscopic imaging ellipsometry for automated search of flakes of mono- and n-layers of 2D-materials Funke S, Wurstbauer U, Miller B, Matkovic A, Green A, Diebold A, Roling C, Thiesen PH Applied Surface Science, 421, 435, 2017 |
| 2 |
Oxide-Free Actuation of Gallium Liquid Metal Alloys Enabled by Novel Acidified Siloxane Oils Holcomb S, Brothers M, Diebold A, Thatcher W, Mast D, Tabor C, Heikenfeld J Langmuir, 32(48), 12656, 2016 |
| 3 |
Spectroscopic ellipsometry studies of 3-stage deposition of CuIn1-xGaxSe2 on Mo-coated glass and stainless steel substrates Sunkoju S, Schujman S, Dixit D, Diebold A, Li J, Collins R, Haldar P Thin Solid Films, 606, 113, 2016 |
| 4 |
5th International Conference on Spectroscopic Ellipsometry (ICSE-V) Preface Tompkins HG, Diebold A, Jellison GE, Collins R, Aspnes D Thin Solid Films, 519(9), 2569, 2011 |
| 5 |
A comparison of thickness values for very thin SiO2 films by using ellipsometric, capacitance-voltage, and HRTEM measurements Ehrstein J, Richter C, Chandler-Horowitz D, Vogel E, Young C, Shah S, Maher D, Foran B, Hung PY, Diebold A Journal of the Electrochemical Society, 153(1), F12, 2006 |
| 6 |
Study of two-dimensional B doping profile in Si fin field-effect transistor structures by high angle annular dark field in scanning transmission electron microscopy mode Garcia-Gutierrez DI, Jose-Yacaman M, Khajetoorians AA, Shih CK, Wang XD, Pham D, Celio H, Diebold A Journal of Vacuum Science & Technology B, 24(2), 730, 2006 |
| 7 |
Application of x-ray metrology in the characterization of metal gate thin films Hung PY, Alshareef H, Lafford T, Bowen DK, Majhi P, Diebold A Journal of Vacuum Science & Technology B, 24(5), 2437, 2006 |
| 8 |
Optical band gaps and composition dependence of hafnium-aluminate thin films grown by atomic layer chemical vapor deposition Nguyen NV, Sayan S, Levin I, Ehrstein JR, Baumvol IJR, Driemeier C, Krug C, Wielunski L, Hung RY, Diebold A Journal of Vacuum Science & Technology A, 23(6), 1706, 2005 |
| 9 |
X-ray reflectometry and x-ray fluorescence monitoring of the atomic layer deposition process for high-k gate dielectrics Hung PY, Gondran C, Ghatak-Roy A, Terada S, Bunday B, Yeung H, Diebold A Journal of Vacuum Science & Technology B, 23(5), 2244, 2005 |
| 10 |
Crystal structures and solution behavior of paramagnetic divalent transition metal complexes (Fe, Co) of the sterically encumbered tridentate macrocycles 1,4,7-R-3-1,4,7-triazacyclononane: Coordination numbers 5 (R = i-Pr) and 6 (R = i-Bu) Diebold A, Elbonadili A, Hagen KS Inorganic Chemistry, 39(17), 3915, 2000 |