검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Measurement of the across-plane conductivity of YSZ thin films on silicon Navickas E, Gerstl M, Friedbacher G, Kubel F, Fleig J Solid State Ionics, 211, 58, 2012 |
| 2 |
Influence of interlayer properties on the characteristics of high-k gate stacks Engstrom O, Mitrovic IZ, Hall S Solid-State Electronics, 75, 63, 2012 |