검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Bulk defects in nano-crystalline and in non-crystalline HfO(2)-based thin film dielectrics Lee S, Seo H, Lucovsky G, Fleming LB, Ulrich MD, Luning J Thin Solid Films, 517(1), 437, 2008 |
| 2 |
Calculated positron annihilation parameters for defects in SiC Staab TEM, Torpo LM, Puska MJ, Nieminen RM Materials Science Forum, 353-356, 533, 2001 |