검색결과 : 15건
| No. | Article |
|---|---|
| 1 |
Full elemental depth-profiling with nanoscale resolution: The potential of Elastic Recoil Detection (ERD) in membrane science Verbeke R, Bergmaier A, Eschbaumer S, Marien H, Dollinger G, Vankelecom IFJ Journal of Membrane Science, 572, 102, 2019 |
| 2 |
Hydrogen microscopy - Distribution of hydrogen in buckled niobium hydrogen thin films Wagner S, Moser M, Greubel C, Peeper K, Reichart P, Pundt A, Dollinger G International Journal of Hydrogen Energy, 38(31), 13822, 2013 |
| 3 |
Correlation of chemical composition and electrical properties of rf sputtered alumina films Voigt M, Bergmaier A, Dollinger G, Sokolowski M Journal of Vacuum Science & Technology A, 27(2), 234, 2009 |
| 4 |
Surface and bulk investigations at the high intensity positron beam facility NEPOMUC Hugenschmidt C, Dollinger G, Egger W, Kogel G, Lowe B, Mayer J, Pikart P, Piochacz C, Repper R, Schreckenbach K, Sperr P, Stadlbauer M Applied Surface Science, 255(1), 29, 2008 |
| 5 |
Status of the pulsed low energy positron beam system (PLEPS) at the Munich Research Reactor FRM-II Sperr P, Egger W, Kogel G, Dollinger G, Hugenschmidt C, Repper R, Piochacz C Applied Surface Science, 255(1), 35, 2008 |
| 6 |
A positron remoderator for the high intensity positron source NEPOMUC Piochacz C, Kogel G, Egger W, Hugenschmidt C, Mayer J, Schreckenbach K, Sperr P, Stadlbauer M, Dollinger G Applied Surface Science, 255(1), 98, 2008 |
| 7 |
Planned positron experiments at FRM-II Kogel G, Dollinger G Applied Surface Science, 252(9), 3111, 2006 |
| 8 |
Optimization of thin, nitrogen-rich silicon oxynitrides grown by rapid thermal nitridation Ludsteck A, Schulze J, Eisele I, Dietl W, Chung H, Nenyei Z, Bergmaier A, Dollinger G Journal of the Electrochemical Society, 152(5), G334, 2005 |
| 9 |
Errors in near-surface and interfacial profiling of boron and arsenic Vandervorst W, Janssens T, Brijs B, Conard T, Huyghebaert C, Fruhauf J, Bergmaier A, Dollinger G, Buyuklimanli T, VandenBerg JA, Kimura K Applied Surface Science, 231-2, 618, 2004 |
| 10 |
An (un)solvable problem in SIMS: B-interfacial profiling Vandervorst W, Janssens T, Loo R, Caymax M, Peytier I, Lindsay R, Fruhauf J, Bergmaier A, Dollinger G Applied Surface Science, 203, 371, 2003 |