화학공학소재연구정보센터
검색결과 : 6건
No. Article
1 The electronic structure peculiarities of a strained silicon layer in silicon-on-insulator: Experimental and theoretical data
Terekhov VA, Nesterov DN, Domashevskaya EP, Geraskina EV, Manyakin MD, Kurganskii SI, Kamayev GN, Antonenko AH, Turishchev SY
Applied Surface Science, 382, 331, 2016
2 Investigations of the composition of macro-, micro- and nanoporous silicon surface by ultrasoft X-ray spectroscopy and X-ray photoelectron spectroscopy
Lenshin AS, Kashkarov VM, Domashevskaya EP, Bel'tyukov AN, Gil'mutdinov FZ
Applied Surface Science, 359, 550, 2015
3 Structural features and surface morphology of AlxGayIn1-x-yAszP1-z/GaAs(100) heterostructures
Seredin PV, Glotov AV, Domashevskaya EP, Arsentyev IN, Vinokurov DA, Tarasov IS
Applied Surface Science, 267, 181, 2013
4 Electronic structure of undoped and doped SnOx nanolayers
Domashevskaya EP, Chuvenkova OA, Ryabtsev SV, Yurakov YA, Kashkarov VM, Shchukarev AV, Turishchev SY
Thin Solid Films, 537, 137, 2013
5 SnOx obtaining by thermal oxidation of nanoscale tin films in the air and its characterization
Domashevskaya EP, Ryabtsev SV, Yurakov YA, Chuvenkova OA, Kashkarov VM, Turishchev SY, Kushev SB, Kukin AN
Thin Solid Films, 515(16), 6350, 2007
6 Silicide Formation in Thin-Film Pt-Si(111) Structure by Usxes Data
Domashevskaya EP, Yurakov YA, Kashkarov VM
Thin Solid Films, 298(1-2), 135, 1997