| 1 |
Morphology correlated free volume studies of multi-walled carbon nanotube plasticized poly (vinyl chloride) nanocomposites: Positronium probes and electrical properties
Francis E, Zhai LD, Kim HC, Ramachandran R, Amarendra G, Balerao GM, Kalarikkal N, Varughese KT, Kim J, Thomas S
Polymer, 141, 232, 2018 |
| 2 |
Morphology correlated free volume studies of multi-walled carbon nanotube plasticized poly (vinyl chloride) nanocomposites: Positronium probes and electrical properties
Francis E, Zhai LD, Kim HC, Ramachandran R, Amarendra G, Balerao GM, Kalarikkal N, Varughese KT, Kim J, Thomas S
Polymer, 141, 232, 2018 |
| 3 |
Useful vacancies: Positron beam interrogation of fluorine-vacancy complexes in semiconductor device structures
Coleman PG, Abdulmalik DA
Applied Surface Science, 255(1), 71, 2008 |
| 4 |
Porosity depth profiling of spin-coated silica thin films produced by different precursors sols
Toniutti L, Mariazzi S, Patel N, Checchetto R, Miotello A, Brusa RS
Applied Surface Science, 255(1), 170, 2008 |
| 5 |
Optimized Coincidence Doppler Broadening Spectroscopy using deconvolution algorithms
Ho KF, Ching HM, Cheng KW, Beling CD, Fung S, Ng KP
Materials Science Forum, 445-6, 477, 2004 |
| 6 |
New defect spectroscopies
Beling CD
Applied Surface Science, 194(1-4), 224, 2002 |
| 7 |
Electronic stability and noise reduction in Doppler broadening spectroscopy systems
Ching HM, Zhang JD, Beling CD, Fung S
Applied Surface Science, 194(1-4), 250, 2002 |
| 8 |
Optimization of measurement parameters in Doppler broadening spectroscopy
Pi XD, Burrows CP, Coleman PG
Applied Surface Science, 194(1-4), 255, 2002 |
| 9 |
Defect identification using positrons
Beling CD, Fung S
Materials Science Forum, 363-3, 25, 2001 |
