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| No. | Article |
|---|---|
| 1 |
Analysis of bias stress on thin-film transistors obtained by Hot-Wire Chemical Vapour Deposition Dosev DK, Puigdollers J, Orpella A, Voz C, Fonrodona M, Soler D, Marsal LF, Pallares J, Bertomeu J, Andreu J, Alcubilla R Thin Solid Films, 383(1-2), 307, 2001 |